Multi-tip SPM instrument development

In quantum nanoscience, it is essential to perform electronic transport measurements at the nanoscale. We design ultra-compact multi-tip scanning probe instruments with we use as a “multimeter at the nanoscale”.

The multimeter at the nanoscale, in which the tips of a multi-tip scanning probe microscope are used as freely positionable contacts, is an alternative to lithographically patterned contacts. The advantages of this approach are:

• In situ contacting of “as grown” nanostructures still under vacuum keeps delicate nanostructures free from contaminations which are often induced by lithography steps.
• Both a flexible positioning of contacting tips and different contact configurations are easy to realize.
• Since each of the tips is a scanning probe microscope with atomic resolution, the contacts can be placed with atomic precision.
• Probing with SPM tips can be performed either non-invasive (high ohmic), or invasive (low ohmic).

Our ultra-compact multi-tip SPMs are commercially available via the spin-off company mProbes.